Three-Dimensional Localization of Nano-Emitters with Nanometer-Level Precision

We show nanometer-level localization accuracy of a single quantum-dot in three dimensions by self-interference and diffraction-pattern analysis. We believe that this approach has the capacity to push optical microscopy to the molecular level.


Published in:
OSA Technical Digest (CD) (Optical Society of America, 2009)
Presented at:
OSA Optics & Photonics Congress, Advances in Imaging, Vancouver, CA, April 26-30, 2009
Year:
2009
Laboratories:




 Record created 2009-07-23, last modified 2018-03-17

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