Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution

We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique real-time capability of our technique, it is shown that axial resolution can be further increased compared to single- wavelength operation thanks to the uncorrelated nature of both recorded wavefronts. It is experimentally demonstrated that DHM topographic investigation within 3 decades measurement range can be achieved with our arrangement, opening new applications possibilities for this interferometric technique.


Published in:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 6861
Presented at:
Photonics West, San Jose, CA, January 19-24, 2008
Year:
2008
Publisher:
SPIE
Keywords:
Laboratories:




 Record created 2009-07-20, last modified 2018-01-28

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