Axial sub-nanometer accuracy in digital holographic microscopy
2008
Details
Title
Axial sub-nanometer accuracy in digital holographic microscopy
Author(s)
Kühn, J. ; Charrière, F. ; Colomb, T. ; Cuche, Etienne ; Montfort, F. ; Emery, Yves ; Marquet, P. ; Depeursinge, Christian
Published in
Measurement Science and Technology
Volume
19
Issue
7
Pages
074007 (8 pages)
Date
2008
Keywords
Other identifier(s)
View record in Web of Science
DAR: 12942
DAR: 12942
Additional link
URL
Laboratories
LOA
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LOA - Advanced Photonics Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2009-07-20