Influence of Positive Ions on the Current-Voltage Characteristics of MOS Structures
1978
Abstract
A new mathematical approach for the influence of mobile positive ions on the current-voltage characteristics of MOS structures is presented. This new method gives formulations which are more applicable than those described in the literature. Examples of the application of these formulations are presented.
Details
Title
Influence of Positive Ions on the Current-Voltage Characteristics of MOS Structures
Author(s)
Tangena, A. G. ; Middelhoek, J. ; de Rooij, N. F.
Published in
Journal of Applied Physics
Volume
49
Issue
5
Pages
2876-2879
Date
1978
Note
3
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Record creation date
2009-05-12