Development of an Aluminum Single Electron Transistor Scanning Probe


Advisor(s):
Staufer, U.
Year:
2008
Publisher:
Université de Neuchâtel
Note:
Jury: N.F. de Rooij (IMT-UniNE), D.P. Kern (Uni Tübingen, Germany)
Laboratories:




 Record created 2009-05-12, last modified 2018-03-17

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