Towards better scanning near-field optical microscopy probes - progress and new developments

Several approaches are described with the aim of producing near-field optical probes with improved properties. Focused ion beam milling allows the fabrication of small apertures in a controlled fashion, resulting in probes with excellent polarization properties and increased transmission. Microfabrication processes are described that allow the production of apertures of 30-50 nm, facilitating the mass-fabrication of apertured tip structures that can be used in a combined force/near-field optical microscope. Finally, possible future developments are outlined.


Published in:
Journal of Microscopy, 194, 2, 365-368
Year:
1999
ISSN:
00222720
Note:
223
Laboratories:




 Record created 2009-05-12, last modified 2018-12-03


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