000137717 001__ 137717
000137717 005__ 20180913055245.0
000137717 0247_ $$2doi$$a10.1002/sia.1182
000137717 037__ $$aARTICLE
000137717 245__ $$aMeasurement of quartz particles by means of an atomic force microscope for planetary exploration
000137717 260__ $$c2002
000137717 269__ $$a2002
000137717 336__ $$aJournal Articles
000137717 500__ $$a282
000137717 520__ $$aWithin the last 2 years our consortium has developed, built and tested an atomic force microscope for planetary science applications, in particular for the study of Martian dust and soil. An array of eight cantilevers and tips provides redundancy in case of tip or cantilever failure. Images can be recorded in both static and dynamic operation modes. As we plan to investigate Martian dust, our interest focuses on the behaviour of the instrument when measuring loose particles in the above-mentioned modes. During scanning, tip contamination with a particle occurs quite frequently, altering the quality of the images. Before changing the cantilever, reverse-imaging the contaminated tip on a tip calibration sample will be performed in order to increase the scientific throughput. We present the results of our test measurements on respirable α-quartz.
000137717 700__ $$0243290$$aGautsch, S.$$g190049
000137717 700__ $$0243294$$aAkiyama, T.$$g190003
000137717 700__ $$aImer, R.
000137717 700__ $$0243301$$ade Rooij, N. F.$$g104887
000137717 700__ $$aStaufer, U.
000137717 700__ $$aNiedermann, Ph.
000137717 700__ $$aHowald, L.
000137717 700__ $$aBrändlin, D.
000137717 700__ $$aTonin, A.
000137717 700__ $$aHidber, H.-R.
000137717 700__ $$aPike, W. T.
000137717 773__ $$j33$$q163-167$$tSurf. Interface Anal.
000137717 909C0 $$0252173$$pSAMLAB$$xU10329
000137717 909CO $$ooai:infoscience.tind.io:137717$$particle
000137717 937__ $$aSAMLAB-ARTICLE-2002-006
000137717 973__ $$aOTHER$$rREVIEWED$$sPUBLISHED
000137717 980__ $$aARTICLE