Details
Title
Application of ECAP on Cu-Ag and Cu-Cr Alloys
Author(s)
Dadras, M. ; Leboeuf, M. ; de Rooij, N. F.
Published in
16th International Microscopy Congress IMC16
Pages
1645
Date
2006
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
Published
Work outside EPFL
Conference Papers
Published
Record creation date
2009-05-12