Dihedral Angle Measurement of Pb in Cu: Advantages of TEM Sample Preparation by FIB
2006
Details
Title
Dihedral Angle Measurement of Pb in Cu: Advantages of TEM Sample Preparation by FIB
Author(s)
Dadras, M. ; Leboeuf, M. ; Felberbaum, L. ; Scherrer, D. ; Laporte, V. ; Vincent, E.
Published in
16th International Microscopy Congress IMC16
Pages
1114
Date
2006
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
Published
Work outside EPFL
Conference Papers
Published
Record creation date
2009-05-12