Microfabricated Scanning Probe Systems for Micro- and Nanoscale Analysis and Structuring of Interfaces
2002
Details
Title
Microfabricated Scanning Probe Systems for Micro- and Nanoscale Analysis and Structuring of Interfaces
Author(s)
Auger, V. ; Akiyama, T. ; de Rooij, N. F. ; Koudelka-Hep, M. ; Campana, F. ; Eichenberger, N. ; Siegenthaler, H. ; Ballesteros Katemann, B. ; Schuhmann, W.
Published in
Twannberg Workshop on Nanoscience
Pages
20
Date
2002
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
Published
Work outside EPFL
Conference Papers
Published
Record creation date
2009-05-12