Scanning Probe with Tuning Fork Sensor, Microfabricated Silicon Cantilever and Conductive Tip for Microscopy at Cryogenic Temperature


Published in:
13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques STM2005
Year:
2005
Laboratories:




 Record created 2009-05-12, last modified 2018-09-13


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