Polarization properties of fully metal coated scanning near-field optical microscopy probes
2003
Details
Title
Polarization properties of fully metal coated scanning near-field optical microscopy probes
Author(s)
Aeschimann, L. ; Vaccaro, L. ; Akiyama, T. ; Staufer, U. ; de Rooij, N. F. ; Eckert, R. ; Heinzelmann, H.
Published in
12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM 03)
Series
AIP Conference Proceedings, 696
Pages
906-910
Date
2003
Note
408
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
Published
Work outside EPFL
Conference Papers
Published
Record creation date
2009-05-12