Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals

We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a ∼ 102 near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations. © 2008 Optical Society of America.


Published in:
Opt. Expr. 16, 8, 5453-5464
Year:
2008
Laboratories:




 Record created 2009-04-22, last modified 2018-09-13


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