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Analysis of mode coupling due to spherical defects in ideal fully metal-coated scanning near-field optical microscopy probes
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Analysis of mode coupling due to spherical defects[...]
-
Nakagawa, W.
et al
main
file(s):
JOSA06_Nakagawa_defects 231096
version 1
JOSA06_Nakagawa_defects 231096.pdf
[765.08 KB]
27 Jan 2018, 13:51
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