Atomic Force Microscopy with Optical Heterodyne Detection Method
2005
Details
Title
Atomic Force Microscopy with Optical Heterodyne Detection Method
Author(s)
Kim, M.-S. ; Manzardo, O. ; Dandliker, R. ; Herzig, H. P. ; Aeschimann, L. ; Staufer, U. ; Vettiger, P. ; Lee, J.-H.
Published in
IEEE/LEOS International Conference on Optical MEMS
Pages
173-174
Date
2005
Laboratories
OPT
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > OPT - Optics and Photonics Technology Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Record creation date
2009-04-22