Absolute metrology for the Very Large Telescope Interferometer (VLTI)
2000
Details
Title
Absolute metrology for the Very Large Telescope Interferometer (VLTI)
Author(s)
Salvadé, Y. ; Courteville, A. ; Dändliker, R.
Published in
Interferometry in Optical Astronomy
Series
Proc. SPIE, 4006
Pages
424-431
Date
2000
Publisher
SPIE-The International Society for Optical Engineering, Bellingham, USA
Laboratories
OPT
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > OPT - Optics and Photonics Technology Laboratory
Work outside EPFL
Conference Papers
Published
Work outside EPFL
Conference Papers
Published
Record creation date
2009-04-22