High resolution far-field measurements of optical microstructures
2000
Details
Title
High resolution far-field measurements of optical microstructures
Author(s)
Blattner, P. ; Rockstuhl, C. ; Herzig, H. P. ; Dändliker, R.
Published in
Engelberg 2000 - Nanoscale Optics
Series
EOS Topical Meetings Digest Series: Vol. 25
Pages
68-69
Date
2000
Publisher
European Optical Society
Laboratories
OPT
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > OPT - Optics and Photonics Technology Laboratory
Work outside EPFL
Conference Papers
Published
Work outside EPFL
Conference Papers
Published
Record creation date
2009-04-22