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Multiple-Wavelength Interferometry for Absolute Distance Measurement

Dändliker, R. ; Salvadé, Y.

Published in:
International Trends in Optics and Photonics / ICO IV, 294-317
Year:
1999
Publisher:
Springer, Berlin
Laboratories:
OPT

Record appears in:
Scientific production and competences > STI - School of Engineering > IMT - Institute of Microengineering > OPT - Optics and Photonics Technology Laboratory
Work outside EPFL
Book chapters
Published



 Record created 2009-04-22, last modified 2018-03-17


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