High resolution hologram interferometry by electronic phase measurement
1998
Details
Title
High resolution hologram interferometry by electronic phase measurement
Author(s)
Dändliker, R. ; Ineichen, B. ; Mottier, F. M.
Published in
Selected papers on Holographic Interferometry Principles and Techniques
Series
SPIE Milestone Series
Volume
144
Pages
295-299
Date
1998
Publisher
SPIE Optical Engineering Press, Bellingham, WA, USA
Laboratories
OPT
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > OPT - Optics and Photonics Technology Laboratory
Work outside EPFL
Book chapters
Published
Work outside EPFL
Book chapters
Published
Record creation date
2009-04-22