Home > Noise-resistant signal processing for electronically scanned white-light interferometry
 

Noise-resistant signal processing for electronically scanned white-light interferometry

Dändliker, R. ; Zimmermann, E. ; Frosio, G.

Published in:
8th Optical Fiber Sensor Conference, Monterey, CA, 53-56
Year:
1992
Publisher:
IEEE Laser and Electro-Optics Society
Laboratories:
OPT

Record appears in:
Scientific production and competences > STI - School of Engineering > IMT - Institute of Microengineering > OPT - Optics and Photonics Technology Laboratory
Work outside EPFL
Conference Papers
Published



 Record created 2009-04-22, last modified 2018-03-17


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