EELS in materials science: Possibilities beyond microanalysis
2000
Details
Title
EELS in materials science: Possibilities beyond microanalysis
Author(s)
Schattschneider, P. ; Nelhiebel, M. ; Hébert, C. ; Weichselbaum, S. ; Schlosser, V. ; Jouffrey, B.
Published in
Microstructural investigation and analysis
Editor(s)
Volume
4
Pages
65-70
Conference
EUROMAT 99 : EUROPEAN CONGRESS on Advanced Materials and Processes, Munich, 27-30 Sept. 1999
Date
2000
Publisher
Wiley
Laboratories
LSME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > LSME - Electron Spectrometry and Microscopy Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2009-02-18