Effect of the excited state lifetime on the near edge structure in EELS or XANES experiments


Published in:
Proceedings EUREM-XII, 3, 333-334
Presented at:
12th EUROPEAN CONGRESS ON ELECTRON MICROSCOPY, Brno, Czech Republic, July 9 - 14, 2000
Year:
2000
Publisher:
Czechoslovak Society for Electron Microscopy
Laboratories:




 Record created 2009-02-18, last modified 2018-03-17


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