000134200 001__ 134200
000134200 005__ 20190415234807.0
000134200 020__ $$a978-0120147656
000134200 037__ $$aBOOK_CHAP
000134200 245__ $$aIonization Edges: some underlying physics and their use in electron microscopy
000134200 269__ $$a2002
000134200 260__ $$bAcademic Press$$c2002$$aNew York
000134200 336__ $$aBook Chapters
000134200 490__ $$aAdvances in imaging and electron physics$$v123
000134200 700__ $$aJouffrey, B.
000134200 700__ $$aSchattschneider, P.
000134200 700__ $$0240075$$g178548$$aHébert, C.
000134200 720_1 $$aHawkes, Peter W.$$eed.
000134200 773__ $$tMicroscopy, spectroscopy, holography and crystallography with electrons$$q413-450
000134200 909C0 $$xU11814$$0252032$$pLSME
000134200 909CO $$pSB$$pchapter$$ooai:infoscience.tind.io:134200$$pbook
000134200 937__ $$aLSME-CHAPTER-2009-001
000134200 973__ $$sPUBLISHED$$aEPFL
000134200 980__ $$aCHAPTER