Investigation of the Electric-Field Profile in Microcrystalline Silicon p-i-n Solar Cells by Cross-Sectional Scanning Kelvin Probe Microscopy
2007
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Title
Investigation of the Electric-Field Profile in Microcrystalline Silicon p-i-n Solar Cells by Cross-Sectional Scanning Kelvin Probe Microscopy
Author(s)
Dominé, D. ; Bailat, J. ; Python, M. ; Wyrsch, N. ; Ballif, C. ; Moutinho, H. R. ; Jiang, C.-S. ; Al-Jassim, M. M.
Date
2007
Note
IMT-NE Number: 470
Laboratories
PV-LAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > PV-LAB - Photovoltaics and Thin Film Electronics Laboratory
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Record creation date
2009-02-10