Infoscience

Conference paper

Investigation of the Electric-Field Profile in Microcrystalline Silicon p-i-n Solar Cells by Cross-Sectional Scanning Kelvin Probe Microscopy

    Note:

    IMT-NE Number: 470

    Reference

    • PV-LAB-CONF-2007-007

    Record created on 2009-02-10, modified on 2016-08-08

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