Image Sensors Based on Thin-film on CMOS Technology: Additional Leakage Currents due to Vertical Integration of the a-Si:H Diodes
2006
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Title
Image Sensors Based on Thin-film on CMOS Technology: Additional Leakage Currents due to Vertical Integration of the a-Si:H Diodes
Author(s)
Miazza, C. ; Wyrsch, N. ; Choong, G. ; Dunand, S. ; Ballif, C. ; Shah, A. ; Blanc, Nicolas ; Kaufmann, R. ; Lustenberger, F. ; Moraes, D. ; Despeisse, M. ; Jarron, P.
Published in
Material Research Society Proceedings
Volume
910
Pages
0910-A17-03
Date
2006
Note
IMT-NE Number: 437
Laboratories
PV-LAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > PV-LAB - Photovoltaics and Thin Film Electronics Laboratory
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Record creation date
2009-02-10