Image Sensors Based on Thin-film on CMOS Technology: Additional Leakage Currents due to Vertical Integration of the a-Si:H Diodes


Published in:
Material Research Society, 0910-A17-03
Year:
2006
Note:
IMT-NE Number: 437
Laboratories:




 Record created 2009-02-10, last modified 2018-11-18

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