Scratching and Brittle Fracture of Semiconductor In-Situ Scanning Electron Microscope
2006
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Details
Title
Scratching and Brittle Fracture of Semiconductor In-Situ Scanning Electron Microscope
Author(s)
Wasmer, K. ; Pouvreau, C. ; Ballif, C. ; Michler, J.
Published in
Proc. of 16th European Conference on Fracture (ECF16)
Date
2006
ISBN
1-4020-4971-4
Note
IMT-NE Number: 435
Laboratories
PV-LAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > PV-LAB - Photovoltaics and Thin Film Electronics Laboratory
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Record creation date
2009-02-10