Scratching and Brittle Fracture of Semiconductor In-Situ Scanning Electron Microscope


Published in:
In Proc. of 16th European Conference on Fracture (ECF16), ISBN: 1-4020-4971-4
Year:
2006
Note:
IMT-NE Number: 435
Laboratories:




 Record created 2009-02-10, last modified 2018-09-13

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