Fast and Sensitive Defect Characterization and Spectral Response Measurement of Thin FIlm Silicon Solar Structures
2004
Files
Details
Title
Fast and Sensitive Defect Characterization and Spectral Response Measurement of Thin FIlm Silicon Solar Structures
Author(s)
Poruba, A. ; Springer, J. ; Mullerova, L. ; Vanecek, M. ; Repman, T. ; Rech, B. ; Kuendig, J. ; Wyrsch, N. ; Shah, A.
Published in
3rd World Conference on Photovoltaic Energy Conversion
Pages
1631-1634
Date
2004
Note
IMT-NE Number: 368
Laboratories
PV-LAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > PV-LAB - Photovoltaics and Thin Film Electronics Laboratory
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Record creation date
2009-02-10