Application of Raman Spectroscopy for the Microstructure Characterisation in Microcrystalline Silicon Solar Cells
2002
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Details
Title
Application of Raman Spectroscopy for the Microstructure Characterisation in Microcrystalline Silicon Solar Cells
Author(s)
Droz, C. ; Vallat-Sauvain, E. ; Bailat, J. ; Feitknecht, L. ; Shah, A.
Published in
17th EC Photovoltaic Solar Energy Conference
Volume
III
Pages
2917-2920
Date
2002
Note
IMT-NE Number: 345
Laboratories
PV-LAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > PV-LAB - Photovoltaics and Thin Film Electronics Laboratory
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Record creation date
2009-02-10