Structural Properties and Electronic Transport in Intrinsic Microcrystalline Silicon Deposited by the VHF-GD Technique


Published in:
J. Non-Crystalline Solids, 227-230, 996-1000
Year:
1998
Note:
IMT-NE Number: 265, http://www.unine.ch/web_pvlab/Publications/PS_files/preprint_265.pdf
Laboratories:


Note: The status of this file is: Involved Laboratories Only


 Record created 2009-02-10, last modified 2018-09-13

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