Infoscience

Journal article

Structural Properties and Electronic Transport in Intrinsic Microcrystalline Silicon Deposited by the VHF-GD Technique

    Note:

    IMT-NE Number: 265, http://www.unine.ch/web_pvlab/Publications/PS_files/preprint_265.pdf

    Reference

    Record created on 2009-02-10, modified on 2016-08-08

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