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Consistency between Experimental Data for Ambipolar Diffusion Length and for Photoconductivity when Incorporated into the Standard Defect Model for a-Si:H
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Consistency between Experimental Data for Ambipola[...]
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Hubin, J.
et al
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paper_214
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paper_214.pdf
[1.45 MB]
27 Jan 2018, 13:12
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