Free Electrons and Defects in Microcrystalline Silicon studied by Electron Spin Resonance
1994
Details
Title
Free Electrons and Defects in Microcrystalline Silicon studied by Electron Spin Resonance
Author(s)
Finger, F. ; Malten, C. ; Hapke, P. ; Carius, R. ; Flückiger, R. ; Wagner, H.
Published in
Phil. Mag. Lett.
Volume
70
Pages
247-254
Date
1994
Note
IMT-NE Number: 186
Laboratories
PV-LAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > PV-LAB - Photovoltaics and Thin Film Electronics Laboratory
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Record creation date
2009-02-10