000133361 001__ 133361
000133361 005__ 20190316234455.0
000133361 02470 $$2ISI$$a000255014801008
000133361 037__ $$aCONF
000133361 245__ $$aSystem-Level Design for Nano-Electronics
000133361 269__ $$a2007
000133361 260__ $$bIEEE Circuits and Systems Society$$c2007$$aNew York
000133361 336__ $$aConference Papers
000133361 520__ $$aLatest fabrication technologies of self-assembly nano-circuits (carbon nanotubes, silicon nanowires, etc.) have deployed bottom-up techniques that reach feature sizes well below 65nm, holding great promise for future large silicon-based integrated circuits. However, new nano-devices intrinsically have much higher failure rates than CMOS-based ones. Thus, new design methodologies must address the combination of devicelevel error-prone technologies with system integration constraints (low power, performance) to deliver competitive devices at the nanometer scale. In this paper we show that a very promising way to achieve nano-scale devices is combining imperfection-aware design techniques during fabrication with gate defect modeling at circuit level. Our results using this approach to define a Carbon Nanotube Field-Effect Transistor (CNFET)-based design flow for nanoscale logic circuits attain more than 3x energy-delay-product advantage compared to 65nm CMOS-based ones.
000133361 6531_ $$asystem-level design
000133361 6531_ $$aCNFET
000133361 6531_ $$aCarbon Nanotube
000133361 6531_ $$aimperfection-aware design
000133361 6531_ $$aCMOS
000133361 700__ $$0240268$$g169199$$aAtienza, David
000133361 700__ $$aBobba, Shashikanth
000133361 700__ $$aPoli, Massimo
000133361 700__ $$0240269$$g167918$$aDe Micheli, Giovanni
000133361 700__ $$aBenini, Luca$$g171049$$0243773
000133361 7112_ $$dDecember 9-12, 2007$$cMarrakech, Morocco$$a14th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
000133361 773__ $$j1$$tProceedings of the 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS)$$k1$$q747-751
000133361 8564_ $$uhttps://infoscience.epfl.ch/record/133361/files/ICECS2007-B7L-A02.pdf$$zn/a$$s723831$$yn/a
000133361 909C0 $$xU11140$$0252283$$pLSI1
000133361 909C0 $$0252050$$pESL$$xU11977
000133361 909CO $$qGLOBAL_SET$$pconf$$pSTI$$pIC$$ooai:infoscience.tind.io:133361
000133361 917Z8 $$x112915
000133361 917Z8 $$x112915
000133361 937__ $$aEPFL-CONF-133361
000133361 973__ $$rREVIEWED$$sPUBLISHED$$aOTHER
000133361 980__ $$aCONF