000133158 001__ 133158
000133158 005__ 20190812205251.0
000133158 0247_ $$a10.1063/1.2908489$$2doi
000133158 02470 $$2DOI$$a10.1063/1.2908489
000133158 037__ $$aCONF
000133158 245__ $$aPressure drop of cable-in-conduit conductors with different void fraction
000133158 269__ $$a2008
000133158 260__ $$c2008$$bAIP
000133158 336__ $$aConference Papers
000133158 490__ $$aADVANCES IN CRYOGENIC ENGINEERING$$v53A and 53B
000133158 700__ $$aBagnasco, M.
000133158 700__ $$aBottura, L.
000133158 700__ $$aBruzzone, P.
000133158 700__ $$aLewandowska, M.
000133158 700__ $$aMarinucci, C.
000133158 700__ $$aStaehli, F.
000133158 7112_ $$dJuly 16-20, 2007$$cChattanooga, TN, USA$$aJoint Cryogenic Engineering Conference/International Cryogenic Materials Conference
000133158 720_1 $$aWeisend, JG$$eed.
000133158 720_1 $$aBarclay, J$$eed.
000133158 720_1 $$aPfotenhauer, J$$eed.
000133158 720_1 $$aRowe, A$$eed.
000133158 720_1 $$aVanSciver, S$$eed.
000133158 720_1 $$aZagarola, M$$eed.
000133158 720_1 $$aZeller, A$$eed.
000133158 720_1 $$aBreon, S$$eed.
000133158 720_1 $$aDemko, J$$eed.
000133158 720_1 $$aDiPirro, M$$eed.
000133158 720_1 $$aKelley, JP$$eed.
000133158 720_1 $$aKittel, P$$eed.
000133158 720_1 $$aKlebaner, A$$eed.
000133158 720_1 $$aLock, J$$eed.
000133158 720_1 $$aPeterson, T$$eed.
000133158 773__ $$q1317-1324$$j985$$tAIP Conference Proceedings
000133158 8560_ $$falain.borel@epfl.ch
000133158 909C0 $$pCRPP
000133158 909C0 $$pSPC$$0252028$$xU10136$$xU12267$$xU12269$$xU12271$$xU10559$$xU12273$$xU10557$$xU12270$$xU10137$$xU10636$$xU12266$$xU10635$$xU10558$$xU12268$$xU12272
000133158 909CO $$pconf$$pSB$$ooai:infoscience.tind.io:133158
000133158 937__ $$aCRPP-PROC-2009-001
000133158 973__ $$rREVIEWED$$aEPFL
000133158 980__ $$aCONF