High resolution time domain reflectometry for optical components
Gilgen, H. H.; Novak, R. P.; Salathe, R. P.; Zysset, B.; Beaud, P.; Hodel, W.; Weber, H. P.
1987

Abstract

A Nd:YAG pumped dye laser emitting light pulses of 0.3 ps width, is used as source for a high resolution optical time domain reflectometer. The operating wavelength is tunable around 1.3 μm and suitable for measurements on structures for applications in the telecommunication sector. The system allows one to resolve two scattering centers separated by less than 15 μm in a GaAs structure. A crosscorrelator is used as detection system and offers a dynamic range of 75 dB by using a lock-in-amplifier technique. This sensitivity allows one to investigate defects in active and passive integrated optical devices

Details

Title High resolution time domain reflectometry for optical components
Author(s) Gilgen, H. H. ; Novak, R. P. ; Salathe, R. P. ; Zysset, B. ; Beaud, P. ; Hodel, W. ; Weber, H. P.
Published in ECOC 87: 13th European Conference on Optical Communication. Technical Digest
Conference Helsinki, Finland
Date 1987
Publisher Consulting Committee Professional Electroeng. Organ. Finland
Keywords
Note Swiss PTT, Tech. Center Bern, Switzerland
3178563
active integrated optical devices
pumped dye laser
high resolution optical time domain reflectometer
crosscorrelator
detection system
lock-in-amplifier technique
passive integrated optical devices
1.3 micron
0.3 ps
GaAs structure
YAG:Nd
YAl5O12:Nd
Laboratories LOA
Record Appears in Scientific production and competences > STI - School of Engineering > STI Archives > LOA - Advanced Photonics Laboratory
Work outside EPFL
Conference Papers
Published
Record creation date 2009-01-20