000130128 001__ 130128
000130128 005__ 20190812205246.0
000130128 037__ $$aCONF
000130128 245__ $$aWavelet Transform Analysis of Truncated Fringe Patterns in 3-D Surface Profilometry
000130128 269__ $$a2005
000130128 260__ $$c2005
000130128 336__ $$aConference Papers
000130128 520__ $$aWavelet transform analysis of projected fringe pattern for phase recovery in 3-D shape measurement of objects is investigated. The present communication specifically outlines and evaluates the errors that creep in to the reconstructed profiles when fringe images do not satisfy periodicity. Three specific cases that give raise to non-periodicity of fringe image are simulated and leakage effects caused by each one of them are analyzed with continuous complex Morlet wavelet transform. Same images are analyzed with FFT method to make a comparison of the reconstructed profiles with both methods. Simulation results revealed a significant advantage of wavelet transform profilometry (WTP), that the distortions that arise due to leakage are confined to the locations of discontinuity and do not spread out over the entire projection as in the case of Fourier transform profilometry (FTP).
000130128 6531_ $$aWavelet Transform
000130128 6531_ $$aFringe Projection
000130128 6531_ $$aSurface Profile
000130128 6531_ $$aFTP
000130128 6531_ $$aLeakage Effect
000130128 6531_ $$aphase demodulation
000130128 6531_ $$aWTP.
000130128 700__ $$0242293$$g176281$$aGorthi, Sai Siva
000130128 700__ $$aLolla, Kameswara Rao
000130128 7112_ $$cBellingham, WA$$aOptical Measurement Systems for Industrial Inspection IV
000130128 773__ $$j5856$$tProceedings of SPIE$$q265-273
000130128 8564_ $$zn/a$$uhttps://infoscience.epfl.ch/record/130128/files/OpticalMetrology_2.pdf$$s450201
000130128 909C0 $$xU10237$$pIMAC$$0252031
000130128 909CO $$ooai:infoscience.tind.io:130128$$qGLOBAL_SET$$pconf$$pENAC
000130128 937__ $$aIMAC-CONF-2008-015
000130128 973__ $$rREVIEWED$$sPUBLISHED$$aOTHER
000130128 980__ $$aCONF