Français
English
Recherche
Browse Collections
Aide
Français
English
identification
identification
Accueil
> >
Optimization of nanoelectronic systems' reliability under massive defect density using Cascaded R-fold modular redundancy
> Accès aux Fichiers
Informations
Fichiers
Optimization of nanoelectronic systems' reliabilit[...]
-
Stanisavljevic, Milos
et al
main
fichier(s):
Restreint
nano8_46_465202
version 1
nano8_46_465202.pdf
[347.75 KB]
27 Jan 2018, 13:16
n/a