Preparation and structural characterization of thin-film CdTe/CdS heterojunctions

The structural characteristics of CdTe/CdS thin-film heterojunctions are investigated. The studied heterojunctions were obtained by successive thermal evaporation under vacuum onto unheated SnO2 coated glass substrates of CdS and CdTe films, respectively. The morphological and structural studies of the above mentioned heterojunction component films, in comparison with those of CdS and CdTe films, deposited separately, onto glass substrates, were carried out using transmission electron microscopy, X-ray diffraction and atomic force microscopy techniques.


Published in:
Journal of Optoelectronics and Advanced Materials, 8, 3, 936-940
Year:
2006
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 Record created 2008-10-12, last modified 2018-09-13

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