Intensity modulation in two Mach-Zehnder interferometers using plasma dispersion in silicon-on-insulator

Two Mach-Zehnder interferometers (MZI), one with Y-junction-couplers and the other with multimode interference (MMI), were presented. Both MZI were developed in silicon-on-insulator (SOI) technology and used plasma dispersion effect for light phase modulation. Fiber-to-fiber insertion losses, absorption coefficients, optical coefficients modulated intensities as function of time and modulation extinction ratios versus signal frequencies were measured for these devices at various wavelengths. Both devices were found to be modulated up to a frequency of 3.5 MHz. Insertion losses at wavelengths equal to 1.3 μm were less than 9.5 dB and excess losses relative to a straight waveguide were less than 2.3 dB.


Published in:
Applied Physics B: Lasers and Optics, 73, 5-6, 475-478
Year:
2001
Publisher:
Springer Verlag
ISSN:
0946-2171
Note:
EPFL, Swiss Federal Institute of Technol., Metrology Laboratory, 1015 Lausanne, Switzerland, Compilation and indexing terms, Copyright 2008 Elsevier Inc., 01546791948, 0946-2171
Other identifiers:
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 Record created 2008-09-29, last modified 2018-03-18

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