000128275 001__ 128275
000128275 005__ 20190316234407.0
000128275 037__ $$aARTICLE
000128275 245__ $$aCut-off wavelength measurements of integrated optical waveguides
000128275 269__ $$a1993
000128275 260__ $$c1993
000128275 336__ $$aJournal Articles
000128275 520__ $$aOne of the most important parameters in the characterization of integrated optical waveguides is the precise determination of the effective cut-off wavelength of the fundamental and the first order mode, since it sets the exact region of single-mode operation. This paper describes an experimental set-up for the measurement of the cut-off wavelengths of integrated optical waveguides, using the technique of spectral light transmission. Measurement results obtained with Ti:LiNbO3 channel waveguides are presented. The effect of different geometrical parameters and fabrication conditions on the cut-off wavelengths of the channel waveguides for both TE and TM mode excitation will be discussed.
000128275 700__ $$aLang, T.
000128275 700__ $$0240503$$g106544$$aThévenaz, Luc
000128275 700__ $$aRen, Z. B.
000128275 700__ $$aRobert, Ph
000128275 773__ $$j56-57$$tAGEN-Mitteilungen$$q55-57
000128275 8564_ $$uhttps://infoscience.epfl.ch/record/128275/files/Mitteilungen%20AGEN%205657%2055-57%20%281993%29.pdf$$zPublisher's version$$s128995$$yPublisher's version
000128275 909C0 $$xUS05033$$0252088$$pTHEVE
000128275 909C0 $$pSCI-STI-LT$$xU12146$$0252591
000128275 909CO $$qGLOBAL_SET$$pSTI$$particle$$ooai:infoscience.tind.io:128275
000128275 917Z8 $$x106544
000128275 937__ $$aTHEVE-ARTICLE-1993-002
000128275 970__ $$a345/THEVE
000128275 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000128275 980__ $$aARTICLE