000124415 001__ 124415
000124415 005__ 20190812205222.0
000124415 037__ $$aCONF
000124415 245__ $$aResults of contact resistance distribution in ETER conductor termination
000124415 269__ $$a2005
000124415 260__ $$c2005
000124415 336__ $$aConference Papers
000124415 700__ $$aAnghel, A.
000124415 700__ $$g113537$$aBruzzone, P.$$0240063
000124415 7112_ $$d18 September 2005$$cGenova, Italy$$a19th International Conference on Magnet Technology
000124415 8564_ $$zURL$$uhttp://mt-19.ge.infn.it/1_home.htm
000124415 909C0 $$pCRPP
000124415 909C0 $$xU12272$$pSPC$$0252028$$xU12268$$xU10558$$xU10635$$xU12266$$xU10636$$xU10137$$xU12270$$xU10557$$xU12273$$xU10559$$xU12271$$xU12269$$xU12267$$xU10136
000124415 909CO $$qGLOBAL_SET$$pconf$$pSB$$ooai:infoscience.tind.io:124415
000124415 937__ $$aCRPP-CONF-2005-065
000124415 970__ $$a3826-CONF/CRPP
000124415 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000124415 980__ $$aCONF