Nanometric defects in Fe in Transmission Electron Microscopy
2006
Details
Title
Nanometric defects in Fe in Transmission Electron Microscopy
Author(s)
Schaeublin, R. ; Yu, G. ; Harjunmaa, A. ; Drudis.Solé, G.
Conference
International Microscopy Conference (IMC-16)
Date
2006
Note
International Microscopy Conference (IMC-16), Sapporo, Japan, 03.09-08.09.2006
Laboratories
CRPP
SPC
SPC
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SPC - Swiss Plasma Center > SPC - Swiss Plasma Center
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2008-05-13