Nanometric defects in Fe in Transmission Electron Microscopy


Presented at:
International Microscopy Conference (IMC-16)
Year:
2006
Note:
International Microscopy Conference (IMC-16), Sapporo, Japan, 03.09-08.09.2006
Laboratories:
SPC
CRPP




 Record created 2008-05-13, last modified 2018-01-28


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