Infoscience

Conference paper

Nanometric defects in Fe in Transmission Electron Microscopy

    Note:

    International Microscopy Conference (IMC-16), Sapporo, Japan, 03.09-08.09.2006

    Reference

    • CRPP-CONF-2006-013

    Record created on 2008-05-13, modified on 2016-08-08

Fulltext

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