CTEM quantification of stacking fault tetrahedra in irradiated Cu
1998
Details
Title
CTEM quantification of stacking fault tetrahedra in irradiated Cu
Author(s)
Schaeublin, R. ; Dai, Y. ; Victoria, M.
Conference
Electron Microscopy 1998
Date
1998
Laboratories
CRPP
SPC
SPC
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SPC - Swiss Plasma Center > SPC - Swiss Plasma Center
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2008-05-13