Microstructure and growth modes of stoichiometric NiAl and Ni3Al thin films deposited by rf-magnetron sputtering
2000
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Title
Microstructure and growth modes of stoichiometric NiAl and Ni3Al thin films deposited by rf-magnetron sputtering
Author(s)
deAlmeida, P. ; Schaeublin, R. ; Almazouzi, A. ; Victoria, M. ; Levy, F.
Date
2000
Keywords
Laboratories
CRPP
SPC
SPC
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SPC - Swiss Plasma Center > SPC - Swiss Plasma Center
Work produced at EPFL
Technical Reports
Published
Work produced at EPFL
Technical Reports
Published
Record creation date
2008-04-18