Safety factor profile requirements for electron ITB formation in TCV

Goodman, T. P.; Behn, R.; Camenen, Y.; Coda, S.; Fable, E.; Henderson, M. A.; Nikkola, P.; Rossel, J.; Sauter, O.; Scarabosio, A.; Zucca, C.; Alberti, S.; Amorim, P.; Andrebe, Y.; Appert, K.; Arnoux, G.; Bortolon, A.; Bottino, A.; Chavan, R.; Condrea, I.; Droz, E.; Duval, B. P.; Etienne, P.; Fasel, D.; Fasoli, A.; Gulejova, B.; Hogge, J. P.; Horacek, J.; Isoz, P. F.; Joye, B.; Karpushov, A.; Kim, S. H.; Klimanov, I.; Lavanchy, P.; Lister, J. B.; Llobet, X.; Madeira, T.; Magnin, J. C.; Marinoni, A.; Marletaz, B.; Marmillod, P.; Martin, Y.; Martynov, A.; Maslov, M.; Mayor, J. M.; Moret, J. M.; Muck, A.; Paris, P. J.; Pavlov, I.; Perez, A.; Pitts, R. A.; Pochelon, A.; Porte, L.; Schlatter, C.; Schombourg, K.; Shidara, H.; Siegrist, M.; Siravo, U.; Sushkov, A. V.; Tonetti, G.; Tran, M. Q.; Weisen, H.; Wischmeier, M.; Zabolotsky, A.; Zhuang, G.; Zhuchkova, A.

doi:10.1088/0741-3335/47/12B/S09

Goodman, T. P.; Behn, R.; Camenen, Y.; Coda, S.; Fable, E.; Henderson, M. A.; Nikkola, P.; Rossel, J.; Sauter, O.; Scarabosio, A.; Zucca, C.; Alberti, S.; Amorim, P.; Andrebe, Y.; Appert, K.; Arnoux, G.; Bortolon, A.; Bottino, A.; Chavan, R.; Condrea, I.; Droz, E.; Duval, B. P.; Etienne, P.; Fasel, D.; Fasoli, A.; Gulejova, B.; Hogge, J. P.; Horacek, J.; Isoz, P. F.; Joye, B.; Karpushov, A.; Kim, S. H.; Klimanov, I.; Lavanchy, P.; Lister, J. B.; Llobet, X.; Madeira, T.; Magnin, J. C.; Marinoni, A.; Marletaz, B.; Marmillod, P.; Martin, Y.; Martynov, A.; Maslov, M.; Mayor, J. M.; Moret, J. M.; Muck, A.; Paris, P. J.; Pavlov, I.; Perez, A.; Pitts, R. A.; Pochelon, A.; Porte, L.; Schlatter, C.; Schombourg, K.; Shidara, H.; Siegrist, M.; Siravo, U.; Sushkov, A. V.; Tonetti, G.; Tran, M. Q.; Weisen, H.; Wischmeier, M.; Zabolotsky, A.; Zhuang, G.; Zhuchkova, A.

2005

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Abstract

On the Tokamak a Configuration Variable (TCV), electron internal transport barriers (eITBs) can be formed during a gradual evolution from a centrally peaked to a hollow current profile while all external actuators are held constant. The formation occurs rapidly (

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Title Safety factor profile requirements for electron ITB formation in TCV

Author(s) Goodman, T. P. ; Behn, R. ; Camenen, Y. ; Coda, S. ; Fable, E. ; Henderson, M. A. ; Nikkola, P. ; Rossel, J. ; Sauter, O. ; Scarabosio, A. ; Zucca, C. ; Alberti, S. ; Amorim, P. ; Andrebe, Y. ; Appert, K. ; Arnoux, G. ; Bortolon, A. ; Bottino, A. ; Chavan, R. ; Condrea, I. ; Droz, E. ; Duval, B. P. ; Etienne, P. ; Fasel, D. ; Fasoli, A. ; Gulejova, B. ; Hogge, J. P. ; Horacek, J. ; Isoz, P. F. ; Joye, B. ; Karpushov, A. ; Kim, S. H. ; Klimanov, I. ; Lavanchy, P. ; Lister, J. B. ; Llobet, X. ; Madeira, T. ; Magnin, J. C. ; Marinoni, A. ; Marletaz, B. ; Marmillod, P. ; Martin, Y. ; Martynov, A. ; Maslov, M. ; Mayor, J. M. ; Moret, J. M. ; Muck, A. ; Paris, P. J. ; Pavlov, I. ; Perez, A. ; Pitts, R. A. ; Pochelon, A. ; Porte, L. ; Schlatter, C. ; Schombourg, K. ; Shidara, H. ; Siegrist, M. ; Siravo, U. ; Sushkov, A. V. ; Tonetti, G. ; Tran, M. Q. ; Weisen, H. ; Wischmeier, M. ; Zabolotsky, A. ; Zhuang, G. ; Zhuchkova, A.

Published in Plasma Physics and Controlled Fusion

Volume 47

Issue 12B

Pages B107-B120

Date 2005

ISSN 0741-3335

Note Sp. Iss. SI Suppl. 12B

DOI https://doi.org/10.1088/0741-3335/47/12B/S09

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Laboratories SPC
LPHE

Record Appears in Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > LPHE - High Energy Physics Laboratory
Scientific production and competences > SB - School of Basic Sciences > SPC - Swiss Plasma Center > SPC - Swiss Plasma Center
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Record creation date 2008-04-16