Effects of ECRH power and safety factor on laser blow-off injected impurity confinement in TCV

Evidence from injection into the TCV device of laser ablated, non-recycling silicon impurities shows that the transport of impurities confinement can be remarkably different from that of energy. The ratio of impurity to energy confinement times ranges from near unity in Ohmic discharges to 5 in the presence of high power ECCD. In Ohmic discharges in deuterium, above a threshold of density and of safety factor near q(95) = 4.5, the impurity confinement time increases abruptly by a factor of 2 and is sometimes accompanied by indefinite retention of non-recycling impurities within the sawtooth mixing radius.


Published in:
Plasma Physics and Controlled Fusion, 46, 5, 857-868
Year:
2004
ISSN:
0741-3335
ISBN:
0741-3335
Other identifiers:
Laboratories:
SPC
CRPP




 Record created 2008-04-16, last modified 2018-01-28


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