On the yield point of icosahedral AlCuFe quasicrystals

Transient creep (1) tests have been performed at the yield point of icosahedral AlCuFe poly-quasicrystalline specimens in order to investigate the actual causes of this phenomenon. The experimental results strongly suggest that the yield point occurrence is essentially related to the lack of dislocation mobility and that a competition does exist between dislocation velocity and short range recovery. (C) 2003 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.


Published in:
Scripta Materialia, 49, 1, 41-46
Year:
2003
ISSN:
1359-6462
ISBN:
1359-6462
Other identifiers:
Laboratories:
SPC
CRPP




 Record created 2008-04-16, last modified 2018-01-28


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